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Transmission Electron Microscopy and Diffractometry of Materials

Transmission Electron Microscopy and Diffractometry of Materials


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About the Book

Diffraction and X-Ray Powder Diffractometer Problems.- TEM and its Optics Problems.- Neutron Scattering Problems.- Scattering Problems.- Inelastic Electron Scattering and Spectroscopy Problems.- Diffraction from Crystals Sphere Problems.- Electron Diffraction and Crystallography Problems.- Diffraction Contrast in TEM Images Problems.- Diffraction Lineshapes Problems.- Patterson Functions and Diffuse Scattering Problems.- High-Resolution TEM Imaging Problems.- High-Resolution STEM and Related Imaging Techniques Problems.- Dynamical Theory Problems.


About the Author:

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials.

James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.


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Product Details
  • ISBN-13: 9783642433153
  • Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
  • Binding: Paperback
  • Height: 234 mm
  • No of Pages: 764
  • Series Title: Graduate Texts in Physics
  • Weight: 1128 gr
  • ISBN-10: 3642433154
  • Publisher Date: 09 Nov 2014
  • Edition: 4 Rev ed
  • Language: English
  • Returnable: Y
  • Spine Width: 40 mm
  • Width: 156 mm


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