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CCD Image Sensors in Deep-Ultraviolet

CCD Image Sensors in Deep-Ultraviolet


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About the Book


About the Author:

Flora Li received her Bachelor of Applied Science degree in Electrical Engineering from University of Waterloo, Canada, in 2002. She completed her MASc degree in Electrical Engineering at University of Waterloo in 2003, where her research focus was on the investigation of deep-UV sensitive CCD image sensors and the related radiation damage issues. She is currently pursuing her Ph.D. degree in the field of organic electronics and polymer TFTs, under the supervision of Prof. Arokia Nathan at the University of Waterloo.

Arokia Nathan received his PhD in Electrical Engineering from the University of Alberta, Edmonton, Alberta, Canada, in 1988, where he was engaged in research related to the physics and numerical modeling of semiconductor microsensors. In 1987, he joined LSI Logic Corp., Santa Clara, CA where he worked on advanced multichip packaging techniques and related issues. Subsequently, he was at the Institute of Quantum Electronics, ETH Zürich, Switzerland. In 1989, he joined the Department of Electrical and Computer Engineering, University of Waterloo, where he is currently a Professor. In 1995, he was a Visiting Professor at the Physical Electronics Laboratory, ETH Zürich. His present research interests lie in fabrication of devices, circuits, and systems using disordered semiconductor, including organic, materials on rigid and mechanically flexible substrates for large area electronics. He held the DALSA/NSERC industrial research chair in sensor technology, and is a recipient of the Natural Sciences and Engineering Research Council E.W.R. Steacie Fellowship. He has published extensively in the field of sensor technology and CAD, and thin film transistor electronics, and is a co-author of the book, Microtransducer CAD, published by Springer in 1999.


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Product Details
  • ISBN-13: 9783540226802
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Depth: 13
  • Height: 229 mm
  • No of Pages: 232
  • Series Title: Microtechnology and Mems
  • Sub Title: Degradation Behavior And Damage Mechanisms
  • Width: 157 mm
  • ISBN-10: 354022680X
  • Publisher Date: 01 Apr 2005
  • Binding: Hardback
  • Edition: 2005 ed.
  • Language: English
  • Returnable: N
  • Spine Width: 15 mm
  • Weight: 589 gr


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