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Atomic Force Microscopy

Atomic Force Microscopy


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About the Book

Introduction.- Part I: Scanning Probe Microscopy Instrumentation.- Harmonic Oscillator.- Technical Aspects of Scanning Probe Microscopy.- Scanning Probe Microscopy Designs.- Electronics for Scanning Probe Microscopy.- Lock-In Technique.- Data Representation and Image Processing.- Artifacts in SPM.- Work Function, Contact Potential, and Kelvin Probe.- Part II: Atomic Force Microscopy (AFM).- Forces between Tip and Sample.- Technical Aspects of Atomic Force Microscopy.- Static Atomic Force Microscopy.- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy.- Intermittent Contact Mode/Tapping Mode.- Mapping of Mechanical Properties Using Force-Distance.- Frequency Modulation (FM) Mode in Dynamic Atomic Force.- Noise in Atomic Force Microscopy.- Quartz Sensors in Atomic Force Microscopy.


About the Author:

Prof. Dr. rer. nat. Bert Voigtländer studied Physics at the University of Cologne and the RWTH Aachen University, earning his Ph.D. in 1989. While a postdoctoral researcher at the IBM Research Center in Yorktown Heights, USA, he began his current field of research using scanning probe microscopy. As a staff scientist at the Jülich Research Centre (Forschungszentrum Jülich), his recent focus has been nanoscale charge transport measurements. In 2012, he founded the spin-off company mProbes, which offers multi-tip scanning probe microscopes. To date, he has authored and co-authored over 100 peer-reviewed publications.


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Product Details
  • ISBN-13: 9783030136536
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Height: 234 mm
  • No of Pages: 331
  • Series Title: Nanoscience and Technology
  • Weight: 716 gr
  • ISBN-10: 3030136531
  • Publisher Date: 03 Jun 2019
  • Binding: Hardback
  • Language: English
  • Returnable: Y
  • Spine Width: 21 mm
  • Width: 156 mm


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