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Tanner Brian K

Tanner Brian K

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1.
Introduction to the Physics of Electrons in Solids
Introduction to the Physics of Electrons in Solids
By: Tanner Brian K, Brian K Tanner, Brian K. Tanner, B K Tanner
Publisher: Cambridge University Press
No Review Yet
AED586
Binding:
Hardback
Release:
30 Mar 1995
Language:
English
International Edition
Ships within 14-16 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
2.
Introduction to the Physics of Electrons in Solids
Introduction to the Physics of Electrons in Solids
By: Tanner Brian K, Brian K Tanner, Brian K. Tanner, B K Tanner
Publisher: Cambridge University Press
No Review Yet
AED260
Binding:
Paperback
Release:
30 Mar 1995
Language:
English
International Edition
Ships within 14-16 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
3.
High Resolution X-Ray Diffractometry and Topography
High Resolution X-Ray Diffractometry and Topography
By: Brian K Tanner, D.K. Bowen, Brian K. Tanner, D. Keith Bowen, D K Bowen
Publisher: CRC Press
No Review Yet
AED604
Binding:
Hardback
Release:
05 Feb 1998
Language:
English
Available
Ships within 12-14 Days Explain..
4.
X-Ray and Neutron Dynamical Diffraction
X-Ray and Neutron Dynamical Diffraction
By: Stefano Lagomarsino, Brian K Tanner, André Authier, Brian K. Tanner, Andre Authier
Publisher: Springer
No Review Yet
AED267
Binding:
Paperback
Release:
24 Oct 2012
Language:
English
International Edition
Ships within 14-16 Days Explain..
5.
X-Ray Metrology in Semiconductor Manufacturing
X-Ray Metrology in Semiconductor Manufacturing
By: Brian K Tanner, D Keith Bowen, Brian K. (University of Durham, UK) Tanner, D. Keith (Bede Plc, Durham, UK) Bowen, D. Keith (Sarah Bowen, PhD, Addictive Behaviors Research Center, University of Washington, Seattle, WA) Bowen
Publisher: CRC Press
No Review Yet
AED1,008
Binding:
Hardback
Release:
24 Jan 2006
Language:
English
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