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Nancy P. S. Hopp

Nancy P. S. Hopp

13 results found
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1.
Clearing the Air
Clearing the Air
By: Mun S Ho, Chris P Nielsen, Mun S. (Visiting Scholar, Harvard University) Ho, Chris P. (Executive Director, Harvard University School of Engineering and Applied Sciences) Nielsen
Publisher: Mit Press
No Review Yet
AED292
Binding:
Mixed media product
Release:
23 Mar 2007
Language:
English
Available
Ships within 9-10 Days Explain..
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2.
Clearer Skies Over China
Clearer Skies Over China
By: Chris P. Nielsen, Mun S Ho, Chris P Nielsen, Jing Cao, Yu Zhao
Publisher: Mit Press
No Review Yet
AED499
Binding:
Hardback
Release:
18 Oct 2013
Language:
English
Available
Ships within 12-14 Days Explain..
Free Shipping in UAE.
3.
Thin Films -- Interfaces and Phenomena: Volume 54
Thin Films -- Interfaces and Phenomena: Volume 54
By: R J Nemanich, P S Ho, S S Lau
Publisher: Cambridge University Press
No Review Yet
AED327
Binding:
Hardback
Release:
15 Apr 1986
Language:
English
Available
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4.
Stress-Induced Phenomena in Metallization
Stress-Induced Phenomena in Metallization
By: Eduard Arzt, Paul S Ho, Shefford P Baker, Matti A Korhonen
Publisher: American Institute of Physics
No Review Yet
AED196
Binding:
Hardback
Release:
09 Apr 2002
Language:
English
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5.
Materials Reliability in Microelectronics III: Volume 309
Materials Reliability in Microelectronics III: Volume 309
By: William F. Filter, Paul S. (University of Texas, Austin) Ho, Harold J. (Dartmouth College, New Hampshire) Frost, Harold J Frost, Kenneth P Rodbell
No Review Yet
AED247
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6.
Stress-Induced Phenomena in Metallization
Stress-Induced Phenomena in Metallization
By: Ehrenfried Zschech, Shinichi Ogawa, P S Ho
Publisher: American Institute of Physics
No Review Yet
AED721
Binding:
Hardback
Release:
13 Nov 2007
Language:
English
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7.
Low Dielectric Constant Materials for IC Applications
Low Dielectric Constant Materials for IC Applications
By: W. W. Lee, P. S. Ho, Paul S. Ho, Wei William Lee, Jihperng Leu
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
AED1,582
Binding:
Hardback
Release:
14 Nov 2002
Language:
English
International Edition
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8.
Materials Reliability in Microelectronics III: Volume 309
Materials Reliability in Microelectronics III: Volume 309
By: William F. Filter, Paul S. (University of Texas, Austin) Ho, Harold J. (Dartmouth College, New Hampshire) Frost, Harold J Frost, Kenneth P Rodbell
Publisher: Cambridge University Press
No Review Yet
AED329
Binding:
Paperback
Release:
05 Jun 2014
Language:
English
International Edition
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Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
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9.
Stress-Induced Phenomena in Metallization
Stress-Induced Phenomena in Metallization
By: No, C y Li, P S Ho, P Totta
Publisher: American Institute of Physics
No Review Yet
AED824
Binding:
Hardback
Release:
27 Mar 1998
Language:
English
Out of Stock
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10.
Topics in Pathology for Hong Kong
Topics in Pathology for Hong Kong
By: Faith C S Ho, P C Wu
Publisher: Hong Kong University Press
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AED278
Binding:
Paperback
Release:
01 Aug 1995
Language:
English
Out of Stock
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11.
Stress Induced Phenomena in Metallization
Stress Induced Phenomena in Metallization
By: Hidekazu Okabayashi, P S Ho, H Okabayashi, S Shingubara
Publisher: American Institute of Physics
No Review Yet
AED1,384
Binding:
Hardback
Release:
01 Oct 1998
Language:
English
Out of Stock
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12.
Stress-Induced Phenomena in Metallization
Stress-Induced Phenomena in Metallization
By: Ehrenfried Zschech, Shinichi Ogawa, P S Ho
Publisher: American Institute of Physics
No Review Yet
AED1,517
Binding:
Hardback
Release:
20 Dec 2010
Language:
English
Out of Stock
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13.
Stress-Induced Phenomena in Metallization
Stress-Induced Phenomena in Metallization
By: Tomoji Nakamura, Cynthia A Volkert, Paul S Ho, Shefford P Baker
Publisher: American Institute of Physics
No Review Yet
AED1,391
Binding:
Hardback
Release:
01 Dec 2004
Language:
English
Out of Stock
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