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1.
VLSI Test Principles and Architectures
VLSI Test Principles and Architectures
By: Charles Stroud, Benoit Nadeau-Dostie, Abhijit Chatterjee, Laung-Terng Wang, Nur Touba
Publisher: Morgan Kaufmann Publishers
No Review Yet
AED776
Binding:
Hardback
Release:
01 Jun 2006
Language:
English
International Edition
Ships within 26-28 Days Explain..
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2.
Electronic Design Automation
Electronic Design Automation
By: Kwang-Ting Cheng, Laung-Terng Wang, Yao-Wen Chang, Cheng, Kwang-Ting (Tim) Cheng
Publisher: Morgan Kaufmann Publishers
No Review Yet
AED773
Binding:
Hardback
Release:
01 Feb 2009
Language:
English
Out of Stock
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3.
VLSI Test Principles and Architectures
VLSI Test Principles and Architectures
By: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, Laung-Terng Wang (Editor), Cheng-Wen Wu (Series Editor)
Publisher: Morgan Kaufmann
No Review Yet
AED904
Binding:
Paperback
Release:
21 Jul 2006
Language:
English
Out of Stock
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4.
System-On-Chip Test Architectures
System-On-Chip Test Architectures
By: Laung-Terng Wang, Charles E. Stroud, Nur Touba, Charles E Stroud, Nur A Touba
Publisher: Morgan Kaufmann Publishers
No Review Yet
AED624
Binding:
Hardback
Release:
01 Nov 2007
Language:
English
Out of Stock
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