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Cary Y. (Santa Clara University) Yang

Cary Y. (Santa Clara University) Yang

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Hot-Carrier Effects in Mos Devices
Hot-Carrier Effects in Mos Devices
By: Eiji Takeda, Akemi Miura-Hamada, Eiji (Hitachi Ltd.) Takeda, Cary Y. (Santa Clara University) Yang, Akemi (Hitachi Ltd.) Miura-Hamada
Publisher: Academic Press
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AED434
Binding:
Hardback
Release:
20 Nov 1995
Language:
English
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