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Brian K Tanner

Brian K Tanner

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1.
High Resolution X-Ray Diffractometry and Topography
Publisher: CRC Press
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AED1,342
Binding:
Hardback
Release:
05 Feb 1998
Language:
English
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4.
X-Ray and Neutron Dynamical Diffraction
Publisher: Springer
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AED593
Binding:
Paperback
Release:
24 Oct 2012
Language:
English
International Edition
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5.
X-Ray Metrology in Semiconductor Manufacturing
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